X-Ray Diffraction Residual Stress Analyzer

Pulstec μ-X360s Portable X-ray
Residual Stress Analyzer

The μ-X360s portable residual stress analyzer is an advanced piece
of equipment that employs the “cos alpha method” for precise
residual stress analysis. This state-of-the-art device is renowned for
its high-speed and high-precision measurement capabilities. It is
adept at evaluating residual stress, Full Width at Half Maximum
(FWHM), and retained austenite, providing essential data for
material science research. The analyzer features a two-dimensional
detector that captures complete diffraction rings, offering in-depth
analysis of crystal structures, grain sizes, and orientations. With the
capability for easy X-ray tube exchanges, the μ-X360s
accommodates a diverse range of materials using various tube
targets including Cr, V, Cu, Co, and Mn.